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Optical Phase Characterization of Photonic Integrated Devices

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Autores UPV

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IEEE Journal of Selected Topics in Quantum Electronics

Abstract

We propose a relatively simple experimental setup, capable of accurately characterizing the optical phase response of an integrated photonic circuit. The setup is based on a phase-noise reduction scheme using an external heterodyne Mach–Zehnder interferometer. In particular, we characterize the phase response of different silicon photonic components: under- and over-coupled ring resonators, and a slow-light corrugated waveguide.