Optical Phase Characterization of Photonic Integrated Devices

Autores UPV
Año
Revista IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS

Abstract

We propose a relatively simple experimental setup, capable of accurately characterizing the optical phase response of an integrated photonic circuit. The setup is based on a phase-noise reduction scheme using an external heterodyne Mach¿Zehnder interferometer. In particular, we characterize the phase response of different silicon photonic components: under- and over-coupled ring resonators, and a slow-light corrugated waveguide.