Abstract
Structural characterization of nanocrystalline Al-doped ZnTe semiconductors, obtained by
mechanical milling from ZnTe and Al2O3 powders, is presented. The samples were
analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray absorption
full spectroscopy (XAFS) and positron annihilation lifetime (PALS) measurements. The
results suggested that Al atoms are substitutional incorporated into the ZnTe cubic
structure
