Abstract
The use of thin films is extensive in both science and industry. We have created
an experimental system that allows us to measure the thicknesses of thin films (with typical
thicknesses of around 1 μm) in real time without the need for any prior knowledge or
parameters. Using the proposed system, we can also measure the refractive index of the
thin film material exactly under the same experimental conditions. We have also obtained
interesting results with regard to structural changes in the solid substance with changing
temperature and have observed the corresponding behavior of mixtures of substances.